Title :
Novel circuit technique for high-speed ECL gates
Author :
Ishii, Kiyoshi ; Suzuki, Katsuya ; Sugimoto, Yoshihiro
Author_Institution :
Dept. of Electron. & Inf. Eng., Chubu Univ., Kasugai, Japan
fDate :
June 28 2009-July 1 2009
Abstract :
We present a novel circuit technique for high-speed emitter-coupled logic (ECL) gates. SPICE simulation indicated the novel ECL circuit technique could boost the operating speed by about 10% above that of a conventional gate without increasing power consumption. In addition, we analyzed the propagation-delay times of conventional and novel ECL gates using SPICE sensitivity analysis, which revealed that our circuit could be operated at high speed because the delay time constants of RLCjC and RbCjC were reduced. In addition, we devised a novel toggle flip-flop (T-FF) circuit using our ECL gates. The simulations demonstrated that the maximum operating frequency of our T-FF was about 10% faster than that of the conventional circuit. Our circuit technique is thus attractive for fabricating ultra-high-speed integrated circuits (ICs) with data rates beyond 50 Gbit/s using Si-based technology.
Keywords :
SPICE; delays; flip-flops; logic gates; SPICE simulation; delay time constants; high-speed emitter-coupled logic gates; propagation delay times; toggle flip-flop circuit; ultra-high-speed integrated circuits; Circuit simulation; Delay effects; Energy consumption; Flip-flops; Frequency; Logic circuits; Logic gates; Propagation delay; SPICE; Sensitivity analysis;
Conference_Titel :
Circuits and Systems and TAISA Conference, 2009. NEWCAS-TAISA '09. Joint IEEE North-East Workshop on
Conference_Location :
Toulouse
Print_ISBN :
978-1-4244-4573-8
Electronic_ISBN :
978-1-4244-4574-5
DOI :
10.1109/NEWCAS.2009.5290483