Title :
Non-volatile 3D stacking RRAM-based FPGA
Author :
Chen, Yi-Chung ; Wang, Wenhua ; Li, Hai Helen ; Zhang, Wei
Author_Institution :
Dept. of Electr. & Comput. Eng., Polytech. Inst. of NYU, New York, NY, USA
Abstract :
We demonstrates a novel Field-Programmable Gate Array (FPGA) structure based on Resistive Random Access Memory (RRAM) system. RRAM is a non-volatile memory device which is compatible to CMOS Back End of Line (BEOL) process with only 4F2 area per cell. We use a 1R system memory for logic element, Look-Up-Table (LUT), with three dimension stacking structure. The proposed 2R memory system is for routing elements, Switch Block (SB) and Connection Block (CB), with Complementary Resistive Switches (CRS) structure. Both three dimension stacking and CRS structure are crossbar-like structure to further improve density of the FPGA. The proposed design is different from modern FPGA with Static Random Access Memory (SRAM) system, RRAM-based FPGA has benefits of non-volatility, smaller area, and flexibility of configuration. A bit-addressable LUT is introduced with function of run-time programming memory cells of LUT, which is also known as Distributed Random Access Memory (D-RAM). Based on our simulation results, 62.7% of area reduction and 34% of delay improvement can be achieved compared to the conventional FPGA.
Keywords :
CMOS memory circuits; DRAM chips; SRAM chips; field programmable gate arrays; logic design; switches; table lookup; 1R system memory; 2R memory system; BEOL process; CMOS back end of line process; CRS structure; DRAM; bit-addressable LUT; complementary resistive switches structure; connection block; crossbar-like structure; distributed random access memory; field-programmable gate array structure; logic element; look-up-table; nonvolatile 3D stacking RRAM-based FPGA; nonvolatile memory device; resistive random access memory system; routing elements; run-time programming memory cell function; static random access memory system; switch block; three dimension stacking structure; CMOS integrated circuits; Delay; Field programmable gate arrays; Microprocessors; Random access memory; Table lookup;
Conference_Titel :
Field Programmable Logic and Applications (FPL), 2012 22nd International Conference on
Conference_Location :
Oslo
Print_ISBN :
978-1-4673-2257-7
Electronic_ISBN :
978-1-4673-2255-3
DOI :
10.1109/FPL.2012.6339206