DocumentCode
1947223
Title
Radar Target Signature Processing While Measuring in Near Field
Author
Hu, Weidong ; Sun, Houjun ; Lv, Xin ; Li, Shiyong
Author_Institution
Beijing Inst. of Technol.
Volume
4
fYear
2006
fDate
16-20 2006
Abstract
Radar target signature is usually measured in near field using step frequency radar system, and Fourier-based methods are conventionally applied to signature processing, but bias lies between near field and far field. RCS is an important signature, which may be extrapolated by simple signal processing algorithm, some results are shown. The one-dimension downrange profiles are also researched based on a model, which is the foundation of image technology. While two dimension scattering centers distribution is measured, ISAR processing technology is used. We often solve the question by digital signal processing, electromagnetic field methods are also necessary to calculate wave scattering and illuminating, if two approaches are combined, maybe some interesting results can be obtained, which is a trend
Keywords
Fourier transforms; electromagnetic fields; electromagnetic wave scattering; radar cross-sections; radar imaging; synthetic aperture radar; Fourier-based methods; ISAR processing technology; RCS; digital signal processing; electromagnetic field methods; extrapolation; image technology; near field; one-dimension downrange profiles; radar target signature processing; step frequency radar system; two dimension scattering centers distribution; wave illuminating; wave scattering; Electromagnetic measurements; Electromagnetic scattering; Frequency measurement; Pulse measurements; Radar antennas; Radar cross section; Radar measurements; Radar scattering; Signal processing; Signal processing algorithms;
fLanguage
English
Publisher
ieee
Conference_Titel
Signal Processing, 2006 8th International Conference on
Conference_Location
Beijing
Print_ISBN
0-7803-9736-3
Electronic_ISBN
0-7803-9736-3
Type
conf
DOI
10.1109/ICOSP.2006.346011
Filename
4129703
Link To Document