• DocumentCode
    1947265
  • Title

    A new method to evaluate BGA pad cratering in lead-free soldering

  • Author

    Xie, Dongji ; Chin, Clavius ; Ang, KarHwee ; Lau, Dennis ; Shangguan, Dongkai

  • Author_Institution
    Flextronics Int., San Jose, CA
  • fYear
    2008
  • fDate
    27-30 May 2008
  • Firstpage
    893
  • Lastpage
    898
  • Abstract
    Pad cratering is one of the most important issues in lead- free soldering. The PCB materials change and the increased reflow temperature account for the degradation of the drop test performance of the PCB materials. This paper uses both finite element analysis (FEA) and experimental testing to study PCB pad lift and adhesion. The pad lift force in pull and shear tests has been determined with the test data, and a new cratering test using ball shear test was proposed for qualifying PCB BGA pads incorporating multiple reflows and mechanical loading.
  • Keywords
    ball grid arrays; circuit testing; finite element analysis; printed circuits; soldering; BGA pad cratering; PCB materials; ball shear test; finite element analysis; printed circuit board; Assembly; Delamination; Environmentally friendly manufacturing techniques; Lead; Materials science and technology; Materials testing; Soldering; Steel; Temperature; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-2230-2
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2008.4550082
  • Filename
    4550082