DocumentCode
1947265
Title
A new method to evaluate BGA pad cratering in lead-free soldering
Author
Xie, Dongji ; Chin, Clavius ; Ang, KarHwee ; Lau, Dennis ; Shangguan, Dongkai
Author_Institution
Flextronics Int., San Jose, CA
fYear
2008
fDate
27-30 May 2008
Firstpage
893
Lastpage
898
Abstract
Pad cratering is one of the most important issues in lead- free soldering. The PCB materials change and the increased reflow temperature account for the degradation of the drop test performance of the PCB materials. This paper uses both finite element analysis (FEA) and experimental testing to study PCB pad lift and adhesion. The pad lift force in pull and shear tests has been determined with the test data, and a new cratering test using ball shear test was proposed for qualifying PCB BGA pads incorporating multiple reflows and mechanical loading.
Keywords
ball grid arrays; circuit testing; finite element analysis; printed circuits; soldering; BGA pad cratering; PCB materials; ball shear test; finite element analysis; printed circuit board; Assembly; Delamination; Environmentally friendly manufacturing techniques; Lead; Materials science and technology; Materials testing; Soldering; Steel; Temperature; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location
Lake Buena Vista, FL
ISSN
0569-5503
Print_ISBN
978-1-4244-2230-2
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2008.4550082
Filename
4550082
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