DocumentCode
1947353
Title
Underfill fracture toughness as a function of cooling rate
Author
Park, Soojae ; Feger, Claudius
Author_Institution
T.J. Watson Res. Center, IBM, Yorktown Heights, NY
fYear
2008
fDate
27-30 May 2008
Firstpage
913
Lastpage
917
Abstract
Organic package failure during thermal cycling to low temperatures is often associated with underfill failure such as fracture. To categorize the propensity of underfills to fracture the fracture toughness measured by applying a mechanical load to the material at a constant temperature is used. However, this fracture toughness is insensitive to cooling rate. In order to account for cooling rate a fracture toughness based on a thermally applied stress is defined and a method to measure this thermally induced fracture toughness and results on a commercial underfill are presented. Thermal shifting factors used for the construction of a relaxation modulus master curve were obtained and used to calculate the rate-dependent thermal stress and thermal stress intensity factor. In separate experiments the mechanically induced fracture toughness of the underfill is determined at various isothermal temperatures. The two fracture toughness values are compared. The thermally induced underfill fracture toughness was found to be nearly 50% smaller than the one induced mechanically. Slower cooling rates resulted in greater thermal fracture toughness. The use of thermally induced fracture toughness values allows more realistic modeling of package lifetimes.
Keywords
fracture toughness; packaging; thermal stresses; cooling rate; isothermal temperatures; mechanically induced fracture toughness; organic package failure; rate-dependent thermal stress; relaxation modulus master curve; thermal cycling; thermal shifting factors; thermal stress intensity factor; thermally applied stress; thermally induced fracture toughness; underfill fracture toughness; Cooling; Mechanical factors; Mechanical variables measurement; Packaging; Stress measurement; Temperature; Testing; Thermal expansion; Thermal factors; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location
Lake Buena Vista, FL
ISSN
0569-5503
Print_ISBN
978-1-4244-2230-2
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2008.4550085
Filename
4550085
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