Aliasing probability of non-exhaustive randomized syndrome tests

Author

Aitken, R.C. ; Agarwal, V.K.

Author_Institution

Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada

fYear

1988

fDate

7-10 Nov. 1988

Firstpage

232

Lastpage

235

Abstract

A comprehensive design methodology which includes built-in self-test (BIST) cannot be achieved without performance measures of BIST techniques. Exact and asymptotic expressions are derived for the aliasing probability of randomized syndrome testing using the independent error model proposed by T.W. Williams et al. (IEEE Trans. Computer-Aided Design, vol.7, no.1, p.75-83, 1988). It is shown that randomized syndrome testing outperforms signature analysis for a substantial class of functions, and that existing methods can be used to transform the remaining functions during test mode.<>

Keywords

automatic testing; logic CAD; performance evaluation; BIST techniques; aliasing probability; asymptotic expressions; built-in self-test; comprehensive design methodology; exact expressions; independent error model; non-exhaustive randomized syndrome tests; performance measures; randomized syndrome testing; signature analysis; test mode; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Combinational circuits; Design for testability; Design methodology; Electric variables measurement; Registers; Turning;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer-Aided Design, 1988. ICCAD-88. Digest of Technical Papers., IEEE International Conference on

Conference_Location

Santa Clara, CA, USA

Print_ISBN

0-8186-0869-2

Type

conf

DOI

10.1109/ICCAD.1988.122500

Filename

122500