DocumentCode
1947734
Title
Attempt to a non-destructive Single Event Burnout test of Fast High Current Thyristors
Author
Senaj, V. ; Ducimetiere, L.
Author_Institution
CERN, Geneva, Switzerland
fYear
2011
fDate
19-23 June 2011
Firstpage
797
Lastpage
801
Abstract
This paper describes an attempt to perform a non-destructive measurement of Single Event Burnout (SEB) failure rate of Fast High Current Thyristors (FHCT) when exposed to cosmic rays and to particle accelerator radiation. FHCTs are used as the power switching components of a beam abort system in the Large Hadron Collider (LHC) and their reliable operation is mandatory for the LHC safety.
Keywords
failure analysis; nondestructive testing; particle accelerators; thyristors; SEB failure rate; beam abort system; cosmic rays; fast high current thyristors; large hadron collider; nondestructive measurement; nondestructive single event burnout test; particle accelerator radiation; power switching components; Capacitance; Cosmic rays; Current measurement; Fuses; Leakage current; Radiation effects; Resistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Conference (PPC), 2011 IEEE
Conference_Location
Chicago, IL
ISSN
2158-4915
Print_ISBN
978-1-4577-0629-5
Type
conf
DOI
10.1109/PPC.2011.6191515
Filename
6191515
Link To Document