Title :
Monolithic integrated surface micromachined pressure sensors with analog on-chip linearization and temperature compensation
Author :
Trieu, H.K. ; Knier, M. ; Köster, O. ; Kappert, H. ; Schmidt, M. ; Mokwa, W.
Author_Institution :
Fraunhofer Inst. of Miceoelectron. Circuits & Syst., Duisburg, Germany
Abstract :
This paper introduces a novel family of monolithic integrated surface micromachined pressure sensors with both linearization and temperature compensation done on-chip. All sensor parameters are fully programmable and on-chip stored using integrated EEPROM. Surface micromachined capacitive pressure sensors are pre-destinated for monolithic integrated sensor systems due to their compatibility to a standard CMOS process. This enables a cost effective production. Compared with piezoresistive pressure sensors, the surface micromachined pressure sensors are superior with respect to high overpressure stability, simple packaging, ease of monolithic integration of signal conditioning electronics, low power consumption and small chip size
Keywords :
CMOS integrated circuits; EPROM; calibration; capacitive sensors; compensation; linearisation techniques; micromachining; microsensors; pressure sensors; stability; analog onchip linearization; capacitive pressure sensors; high overpressure stability; integrated EEPROM; low power consumption; monolithic integrated pressure sensors; onchip storage; onchip temperature compensation; packaging; programmable sensor parameters; signal conditioning electronics; standard CMOS process; surface micromachined pressure sensors; CMOS process; Capacitive sensors; Costs; EPROM; Electronics packaging; Piezoresistance; Production; Sensor systems; Stability; Temperature sensors;
Conference_Titel :
Micro Electro Mechanical Systems, 2000. MEMS 2000. The Thirteenth Annual International Conference on
Conference_Location :
Miyazaki
Print_ISBN :
0-7803-5273-4
DOI :
10.1109/MEMSYS.2000.838576