• DocumentCode
    1947977
  • Title

    Limitations of incremental signal-tracing for FPGA debug

  • Author

    Hung, Eddie ; Wilton, Steven J E

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of British Columbia, Vancouver, BC, Canada
  • fYear
    2012
  • fDate
    29-31 Aug. 2012
  • Firstpage
    49
  • Lastpage
    56
  • Abstract
    Developing state-of-the-art custom silicon can be a prohibitively expensive and risky undertaking, due in no small part to the need to perform thorough design verification. Field-Programmable Gate-Arrays offer a flexible platform for constructing prototypes to aid in their verification, but unlike software simulation, observability into these prototypes is a major challenge. Designers can choose to insert trace-instrumentation to enhance on-chip observability, but doing so often requires re-compiling the entire design for each new trace configuration. This work presents two contributions: to explore the limitations of incremental-synthesis for trace-buffer insertion, and to propose CAD optimizations exclusive to this application for improving runtime and routability. We find that 99.4% of all used cluster outputs (driving both combinational and sequential circuit signals) can be incrementally-traced to 75% of the free memory-capacity on an FPGA, an order of magnitude quicker than the original compilation and with a nominal impact on circuit delay, for a 20% minimum channel width (10% area) increase.
  • Keywords
    buffer circuits; field programmable gate arrays; logic CAD; optimisation; CAD optimization; FPGA debug; combinational circuit signal; field-programmable gate-array; free memory-capacity; on-chip observability enhancement; sequential circuit signal; signal-tracing incremental synthesis; software simulation; trace-buffer insertion; Abstracts; Field programmable gate arrays; Wireless sensor networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Field Programmable Logic and Applications (FPL), 2012 22nd International Conference on
  • Conference_Location
    Oslo
  • Print_ISBN
    978-1-4673-2257-7
  • Electronic_ISBN
    978-1-4673-2255-3
  • Type

    conf

  • DOI
    10.1109/FPL.2012.6339240
  • Filename
    6339240