• DocumentCode
    1947992
  • Title

    Application of through mold via (TMV) as PoP base package

  • Author

    Kim, Jinseong ; Lee, Kiwook ; Park, Dongjoo ; Hwang, Taekyung ; Kim, Kwangho ; Kang, DaeByoung ; Kim, Jaedong ; Lee, ChoonHeung ; Scanlan, Christopher ; Berry, CJ ; Zwenger, Curtis ; Smith, Lee ; Dreiza, Moody ; Darveaux, Robert

  • Author_Institution
    R&D Center, Amkor Technol. Korea Inc., Seoul
  • fYear
    2008
  • fDate
    27-30 May 2008
  • Firstpage
    1089
  • Lastpage
    1092
  • Abstract
    In recent years, package-on-package (PoP) has been rapidly adopted for 3D integration of logic and memory within mobile handsets and other portable multimedia devices. However, existing methods of making the PoP base package may not satisfy next generation applications that will require reduced memory interface pitches, higher memory interface pin-counts, reduced thickness, tight warpage control and higher levels of integration within the PoP base package. This paper introduces a new PoP base package structure that addresses the challenges of next generation applications. A PoP base package with through mold vias (TMV) will be described. Package flatness and package stacking results will be presented and advantages of TMV technology will be reviewed.
  • Keywords
    integrated circuit packaging; integrated logic circuits; mobile handsets; moulding; portable instruments; printed circuit manufacture; soldering; 3D logic device integration; PoP base package; memory devices; memory interface pin-counts; memory interface pitches; mobile handsets; package flatness; package stacking; package-on-package; portable multimedia devices; through mold via; tight warpage control; Bonding; Logic devices; Memory architecture; Packaging; Stacking; Telephone sets; Testing; Thickness control; Vehicles; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-2230-2
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2008.4550110
  • Filename
    4550110