• DocumentCode
    1948008
  • Title

    A dual face package using a post with wire component: Novel structure for PoP, wafer level CSP and compact image sensor packages

  • Author

    Ishihara, Masamichi ; Takehara, Yasuyuki ; Yano, Takumi ; Ino, Yoshihiko ; Kurogi, Takashi ; Hashimoto, Kenji ; Kawano, Hirotada

  • Author_Institution
    Kyushu Inst. of Technol., Kitakyushu
  • fYear
    2008
  • fDate
    27-30 May 2008
  • Firstpage
    1093
  • Lastpage
    1098
  • Abstract
    Information is presented regarding a newly developed bottom package of a package on package (PoP) structure referred to as a dual face package (DFP). Two types of DFP have been developed; one is DFP-PO (POst type), and the other is DFP-PW (Post with Wire component type). 116 PoPs were experimentally produced using DFP-PO. The assembly yield was 100% and there were no failures in a 500 thermocycle PoP test. There was no failure of the DFP-PW under thermocycle testing of a single package over 150 cycles. The DFP-PW was assembled using a post with wire component (PWC), newly developed by Kyushu Institute of Technology and a cooperative enterprise. Using this PWC, compact and thin DFP were achieved, in comparison with the current bottom package of PoP. The PWC contributes a compact and simple JISSO package for the semiconductor field besides PoP such as embedded IC substrates, image sensor packages and wafer level chip size packages (WLCSP).
  • Keywords
    chip scale packaging; image sensors; monolithic integrated circuits; wafer level packaging; compact image sensor packages; dual face package; embedded IC substrates; package on package structure; thermocycle testing; wafer level CSP; wafer level chip size packages; Assembly; Chip scale packaging; Electronics packaging; Image sensors; Integrated circuit packaging; Semiconductor device packaging; Testing; Through-silicon vias; Wafer scale integration; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-2230-2
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2008.4550111
  • Filename
    4550111