• DocumentCode
    1948076
  • Title

    Implementation of a mobile phone module with redistributed chip packaging

  • Author

    Ramanathan, Lakshmi N. ; Keser, Beth ; Amrine, Craig ; Duong, Trung ; Hayes, Scott ; Leal, George ; Mangrum, Marc ; Mitchell, Douglas ; Wenzel, Robert

  • Author_Institution
    Freescale Semicond. Inc., Tempe, AZ
  • fYear
    2008
  • fDate
    27-30 May 2008
  • Firstpage
    1117
  • Lastpage
    1120
  • Abstract
    The redistributed chip packaging is an embedded chip technology that eliminates the need for wirebonds and flip chip bumps. This technology enables smaller packages at a lower cost, while providing improved mechanical, electrical and thermal performance. The process involves producing panels placing the chip active face down along with an embedded ground plane (EGP) and screen printing encapsulant to embed the die. Subsequently alternate layers of dielectric and Cu metallization are built up and the packages are sawn into individual units. The use of wafer fabrication tools enables finer lines and spaces in the build-up layers. This paper will discuss process conditions during the panelization and the integration of the base function of an i.275 GSM/EDGE mobile phone into a single module measuring a maximum of 1 square inch. The design of the EGP and the role of simulations to achieve a robust, reliable package will also be discussed. The outputs included moisture sensitivity level (MSL) 3 testing, air-to-air thermal cycling (- 40C/125C) and unbiased highly accelerated stress testing (HAST). Testing of RCP packages will also be discussed.
  • Keywords
    electronics packaging; microprocessor chips; mobile radio; RCP packages; embedded chip technology; embedded ground plane; flip chip bumps; i.275 GSM/EDGE mobile phone; mobile phone module; redistributed chip packaging; reliable package; screen printing encapsulant; wafer fabrication tools; wirebonds; Costs; Dielectrics; Fabrication; Flip chip; Metallization; Mobile handsets; Packaging; Printing; Testing; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-2230-2
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2008.4550115
  • Filename
    4550115