• DocumentCode
    1948169
  • Title

    Analysis of copper treatments and the effects on signal propagation

  • Author

    Pytel, Steven G. ; Huray, P.G. ; Hall, S.H. ; Mellitz, R.I. ; Brist, G.

  • Author_Institution
    Intel Corp., Columbia, SC
  • fYear
    2008
  • fDate
    27-30 May 2008
  • Firstpage
    1144
  • Lastpage
    1149
  • Abstract
    As computer data rates increase into the 30 - 50 Gb/s range fundamental material challenges emerge that make it difficult to design a robust electrical interconnect between the transmitter and receiver. This paper discusses the effects of differing copper treatments and the effects these treatments have on signal propagation for a computer electrical interconnect. Two types of treatments have been studied: high profile copper (HPC) and low profile copper (LPC). Discussions on the physical surface geometry and elemental analyses of these copper types along with their signaling effects are discussed below.
  • Keywords
    copper; integrated circuit interconnections; receivers; signal processing; transmitters; Cu; computer electrical interconnect; copper treatment; high profile copper; low profile copper; physical surface geometry; receiver; signal propagation; signaling effects; transmitter; Cathodes; Copper; Detectors; Dielectrics; Integrated circuit interconnections; Rough surfaces; Scanning electron microscopy; Signal analysis; Surface roughness; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-2230-2
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2008.4550120
  • Filename
    4550120