DocumentCode
1948169
Title
Analysis of copper treatments and the effects on signal propagation
Author
Pytel, Steven G. ; Huray, P.G. ; Hall, S.H. ; Mellitz, R.I. ; Brist, G.
Author_Institution
Intel Corp., Columbia, SC
fYear
2008
fDate
27-30 May 2008
Firstpage
1144
Lastpage
1149
Abstract
As computer data rates increase into the 30 - 50 Gb/s range fundamental material challenges emerge that make it difficult to design a robust electrical interconnect between the transmitter and receiver. This paper discusses the effects of differing copper treatments and the effects these treatments have on signal propagation for a computer electrical interconnect. Two types of treatments have been studied: high profile copper (HPC) and low profile copper (LPC). Discussions on the physical surface geometry and elemental analyses of these copper types along with their signaling effects are discussed below.
Keywords
copper; integrated circuit interconnections; receivers; signal processing; transmitters; Cu; computer electrical interconnect; copper treatment; high profile copper; low profile copper; physical surface geometry; receiver; signal propagation; signaling effects; transmitter; Cathodes; Copper; Detectors; Dielectrics; Integrated circuit interconnections; Rough surfaces; Scanning electron microscopy; Signal analysis; Surface roughness; Surface treatment;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location
Lake Buena Vista, FL
ISSN
0569-5503
Print_ISBN
978-1-4244-2230-2
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2008.4550120
Filename
4550120
Link To Document