Title :
Sub-nanosecond electron emission from electrically gated Field Emitting Arrays
Author :
Paraliev, M. ; Tsujino, S. ; Gough, C. ; Kirk, E. ; Ivkovic, S.
Author_Institution :
Paul Scherrer Inst., Villigen, Switzerland
Abstract :
Field Emitting Arrays (FEAs) are a promising alternative to the conventional cathodes in different vacuum electronic devices such as traveling wave tubes, electron accelerators and etc. Electrical gating and modulation capabilities, together with the ability to produce stable and homogeneous electron beam in high electric field environment are the key requirements for their practical application. Due to relatively high gate capacitance, fast controlling of FEA emission is difficult. In order to achieve sub-nanosecond, electrically controlled, FEA based electron emission a special pulsed gate driver was developed. Bipolar high voltage (HV) pulses are used to rapidly inject and remove charge form FEA gate electrode controlling quickly electron extraction gate voltage. Short electron emission pulses (<;600 ps FWHM) were observed in low and high gradient (up to 12 MV/m) environment. First attempts were made to combine FEA based electron emission with radio frequency acceleration structures (1.5 GHz) using pulsed preacceleration. The gate driver design together with low inductance FEA chip contact system is described. The results obtained in low and high gradient experimental setups are presented and discussed.
Keywords :
cathodes; electron accelerators; electron beams; electron emission; field emitter arrays; travelling wave tubes; bipolar high voltage pulse; cathodes; electrical gating; electron accelerators; electron beam; electron emission pulse; field emitting arrays; gate electrode; modulation capability; pulsed gate driver; pulsed preacceleration; radiofrequency acceleration; sub-nanosecond electron emission; traveling wave tubes; vacuum electronic devices; Bonding; Electric fields; Logic gates; Modulation; Radio frequency; Shape; Switches;
Conference_Titel :
Pulsed Power Conference (PPC), 2011 IEEE
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4577-0629-5
DOI :
10.1109/PPC.2011.6191535