• DocumentCode
    1948416
  • Title

    Fast broadband macromodeling technique of sampled time/frequency data using z-domain vector-fitting method

  • Author

    Mekonnen, Yidnek S. ; Schutt-Aine, Jose E.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL
  • fYear
    2008
  • fDate
    27-30 May 2008
  • Firstpage
    1231
  • Lastpage
    1235
  • Abstract
    The vector-fitting algorithm has been used as the main macromodeling tool for approximating frequency domain responses of complex interconnects and electrical packages (Gustavsen, 1999). In this paper, a new methodology is proposed to fit transfer functions of frequency response data obtained from numerical electromagnetic simulation or measured frequency-domain or time-domain response data. This new method, z-domain vector-fitting (ZDVF), is a formulation of vector- fitting method in the z domain; it has an advantage of faster convergence and better numerical stability compared to the s-domain vector-fitting method(VF). The fast convergence of the method reduces the overall macromodel generation time. The accuracy, numerical stability and convergence speed of VF and ZDVF are compared. Examples are provided to demonstrate the advantage of the ZDVF.
  • Keywords
    frequency response; integrated circuit modelling; numerical stability; time-frequency analysis; transfer functions; broadband macromodeling technique; frequency domain responses; frequency response data; macromodel generation time; numerical electromagnetic simulation; numerical stability; time-domain response data; time/frequency data; transfer functions; z-domain vector-fitting method; Convergence of numerical methods; Electromagnetic measurements; Frequency domain analysis; Frequency measurement; Frequency response; Numerical simulation; Numerical stability; Packaging; Time domain analysis; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-2230-2
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2008.4550132
  • Filename
    4550132