Guest Editors´ Introduction: Speeding Up Analog Integration and Test for Mixed-Signal SoCs

The seven articles in this special section initiatives to standardize methods, measurements, and tools that support mixed-signal design. The papers are organized along the lines of the overall design-to-test flow, covering verification, selection of test content, defect level estimation, silicon validation, and data-driven test optimization and yield recovery. Presents examples on how to perform comprehensive verification, how to measure and ensure adequate analog test coverage, and how to create and track a specification compliance matrix across the entire design-to-manufacturing flow.