DocumentCode :
1948521
Title :
Development of novel, flexible, electrically conductive adhesives for next-generation microelectronics interconnect applications
Author :
Li, Yi ; Yim, M.J. ; Moon, K. ; Zhang, R.W. ; Wong, C.P.
Author_Institution :
Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA
fYear :
2008
fDate :
27-30 May 2008
Firstpage :
1272
Lastpage :
1276
Abstract :
In this paper, a novel flexible electrically conductive adhesive (FECA) has been designed for electronic interconnect applications that require high flexibility at the interconnects, such as assembly and repair of flexible circuits on flexible substrates and connectors. The physical properties of the resulting FECAs such as the elastic moduli, glass transition temperatures, adhesion strength and electrical properties were characterized by differential scanning calorimetry (DSC), dynamic mechanical analyzer (DMA), thermomechanical analyzer (TMA), die shear tester and multimeter electrical measurement. A high performance FECA with tunable modulus, flowability, glass transition temperature, electrical conductivity and adhesion strength was developed for the next-generation large scale flexible flat panel displays applications.
Keywords :
calorimetry; conductive adhesives; electrical conductivity; integrated circuit interconnections; integrated circuits; adhesion strength; die shear tester; differential scanning calorimetry; dynamic mechanical analyzer; elastic moduli; electrical conductivity; electrically conductive adhesives; glass transition temperatures; microelectronics interconnect applications; multimeter electrical measurement; thermomechanical analyzer; Assembly; Calorimetry; Conductive adhesives; Connectors; Flexible printed circuits; Glass; Integrated circuit interconnections; Mechanical factors; Microelectronics; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location :
Lake Buena Vista, FL
ISSN :
0569-5503
Print_ISBN :
978-1-4244-2230-2
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2008.4550138
Filename :
4550138
Link To Document :
بازگشت