DocumentCode :
1948569
Title :
Multi-walled carbon nanotube/nanocrystalline copper nanocomposite film as an interconnect material
Author :
Yoo, Jung Joon ; Song, Jae Yong ; Yu, Jin ; Lyeo, Ho Ki ; Lee, Sungjun ; Hahn, Jun Hee
Author_Institution :
Dept. of Mater. Sci. & Eng., KAIST, Daejeon
fYear :
2008
fDate :
27-30 May 2008
Firstpage :
1282
Lastpage :
1286
Abstract :
We fabricated nanocomposite films comprising multi- walled carbon nanotubes (MWCNTs, diameter 10~40 nm, length > 1 mum) and nanocrystalline copper using a low cost electrochemical method. Owing to pulse deposition with several additives, MWCNTs were well-dispersed in the films through thickness and the nanocomposite films showed a dense structure without any voids. For the purpose of evaluation as a candidate for electronic interconnection, elastic modulus, hardness, electrical resistivity, and thermal conductivity of MWCNT/Cu nanocomposite films were measured using nanoindentation, four probe, and time-domain thermo-reflectance methods. It was found that the mechanical properties were more or less enhanced due to the addition of MWCNTs but electrical and thermal conductivities of nanocomposite films were drastically decreased. Further studies are needed for the application of electroplated MWCNT/Cu nanocomposite films as next generation interconnecting materials of electronic devices.
Keywords :
carbon nanotubes; copper; elastic moduli; electrical resistivity; hardness; nanocomposites; thermal conductivity; C-Cu; elastic modulus; electrical resistivity; electrochemical method; electronic interconnection; hardness; interconnect material; multiwalled carbon nanotube/nanocrystalline copper nanocomposite film; nanocomposite films; thermal conductivity; time-domain thermo-reflectance methods; Additives; Carbon nanotubes; Conductive films; Copper; Costs; Electric resistance; Nanostructured materials; Organic materials; Thermal conductivity; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location :
Lake Buena Vista, FL
ISSN :
0569-5503
Print_ISBN :
978-1-4244-2230-2
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2008.4550140
Filename :
4550140
Link To Document :
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