DocumentCode
1948673
Title
A two-stage variation-aware placement method for FPGAS exploiting variation maps classification
Author
Guan, Zhenyu ; Wong, Justin S J ; Chaudhuri, Sumanta ; Constantinides, George ; Cheung, Peter Y K
Author_Institution
Dept. of Electr. & Electron. Eng., Imperial Coll. London, London, UK
fYear
2012
fDate
29-31 Aug. 2012
Firstpage
519
Lastpage
522
Abstract
Technology scaling causes increasing and unavoidable delay variability in FPGAs. This paper proposes a 2-stage variation-aware placement method that benefits from the optimality of a full-chipwise (chip-by-chip) placement but only requires a fraction of total execution time for a large number of FPGAs with different variation patterns. By classifying variation maps into finite number of classes, variation-aware placement only need to be executed based on the median map of each class to produce the placement for the other FPGAs (variation maps) in that class to save execution time. Our proposed method is implemented in a modified version of VPR 5.0 and verified using variation maps measured from 129 DE0 boards equipped with Cyclone III FPGAs. The mean timing gain of 7.36% is observed in 20 MCNC benchmarks with 16 clusters, while reducing execution time by a factor of 8 compared to full-chipwise placement.
Keywords
field programmable gate arrays; pattern classification; Cyclone III FPGA; DE0 boards; MCNC benchmarks; VPR 5.0 modified version; chip-by-chip placement; full-chipwise placement; maps classification; two-stage variation-aware placement method; Benchmark testing; Delay; Field programmable gate arrays; Optimization; Principal component analysis; Routing;
fLanguage
English
Publisher
ieee
Conference_Titel
Field Programmable Logic and Applications (FPL), 2012 22nd International Conference on
Conference_Location
Oslo
Print_ISBN
978-1-4673-2257-7
Electronic_ISBN
978-1-4673-2255-3
Type
conf
DOI
10.1109/FPL.2012.6339269
Filename
6339269
Link To Document