DocumentCode

1949270

Title

An Soi Performance Sizing Using Transient Finite-Element Modeling

Author

Mandelman, J.A.

Author_Institution

IBM Technology Products, Essex Junction, VT

fYear

1992

fDate

6-8 Oct. 1992

Firstpage

74

Lastpage

75

Keywords

CMOS technology; Capacitance; Circuits; Delay; Doping; Finite element methods; Inverters; Semiconductor device modeling; Semiconductor process modeling; Steady-state;

fLanguage

English

Publisher

ieee

Conference_Titel

SOI Conference, 1992. IEEE International

Conference_Location

Ponte Vedra Beach, FL

ISSN

1078-621X

Print_ISBN

0-7803-7439-8

Type

conf

DOI

10.1109/SOI.1992.664801

Filename

664801