• DocumentCode
    1949384
  • Title

    A simple electrical model of acute and chronic injury (CTD) processes

  • Author

    LaCourse, John R. ; McCoy, Thom

  • Author_Institution
    Biomed. Eng. Center, New Hampshire Univ., Durham, NH, USA
  • fYear
    1994
  • fDate
    17-18 Mar 1994
  • Firstpage
    69
  • Lastpage
    70
  • Abstract
    A simple electrical analog model is used to understand the mechanisms of acute versus chronic disease processes, especially cumulative trauma disease. The model employs an RC circuit with inputs that allows typical exposure regimes
  • Keywords
    medicine; physiological models; RC circuit; acute injury processes; chronic injury processes; cumulative trauma disease; simple electrical analog model; typical exposure regimes; Biomedical engineering; Circuits; Costs; Diseases; Electric resistance; Human factors; Immune system; Injuries; Research and development; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bioengineering Conference, 1994., Proceedings of the 1994 20th Annual Northeast
  • Conference_Location
    Springfield, MA
  • Print_ISBN
    0-7803-1930-3
  • Type

    conf

  • DOI
    10.1109/NEBC.1994.305173
  • Filename
    305173