• DocumentCode
    1949571
  • Title

    Reducing read latency of phase change memory via early read and Turbo Read

  • Author

    Nair, Prashant J. ; Chiachen Chou ; Rajendran, Bipin ; Qureshi, Moinuddin K.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2015
  • fDate
    7-11 Feb. 2015
  • Firstpage
    309
  • Lastpage
    319
  • Abstract
    Phase Change Memory (PCM) is an emerging memory technology that can enable scalable high-density main memory systems. Unfortunately, PCM has higher read latency than DRAM, resulting in lower system performance. This paper investigates architectural techniques to improve the read latency of PCM. We observe that there is a wide distribution in cell resistance in both the SET state and the RESET state, and that the read latency of PCM is designed conservatively to handle the worst case cell. If PCM sensing can be tuned to exploit the variability in cell resistance, then we can get reduced read latency. We propose two schemes to enable better-than-worst-case read latency for PCM systems. Our first proposal, Early Read, reads the data earlier than the specified time period. Our key observation that Early Read causes only unidirectional errors (SET being read as RESET) allows us to efficiently detect data errors using Berger codes. In the uncommon case that Early Read causes data error(s), we simply retry the read operation with original latency. Our evaluations show that Early Read can reduce the read latency by 25% while incurring a storage overhead of only 10 bits per 64 byte line. Our second proposal, Turbo Read, reduces the sensing time for read operations by pumping higher current, at the expense of accidentally switching the PCM cell with small probability during the read operation. We analyze Error Correction Codes (ECC) and Probabilistic Row Scrubbing (PRS) for maintaining data integrity under Turbo Read. We show that a combination of Early Read and Turbo Read can reduce the PCM read latency by 30%, improve the system performance by 21%, and reduce the Energy Delay Product (EDP) by 28%, while requiring minimal changes to the memory system.
  • Keywords
    error correction codes; phase change memories; read-only storage; ECC; EDP; PCM; PRS; RESET state; cell resistance; early read; energy delay product; error correction code; phase change memory; probabilistic row scrubbing; read latency reduction; turbo read; Bit error rate; Computer architecture; Error correction codes; Microprocessors; Phase change materials; Resistance; Sensors; Berger Codes; ECC; Error Detecting Codes; Phase Change Memory; Read Disturbance; Read Latency; Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Performance Computer Architecture (HPCA), 2015 IEEE 21st International Symposium on
  • Conference_Location
    Burlingame, CA
  • Type

    conf

  • DOI
    10.1109/HPCA.2015.7056042
  • Filename
    7056042