Title :
Versatile RF Measurement System to Thoroughly Evaluate the Non-linear Behaviour of SOI versus Bulk CMOS Technologies
Author :
Schreurs, D. ; Vandenberghe, S. ; Nauwelaers, B. ; Meer, H. Van ; Lyu, J. ; Kubicek, S. ; Meyer, K. De
Author_Institution :
Katholieke Universiteit Leuven, Belgium
Keywords :
CMOS technology; Circuits; Fabrication; MOS devices; MOSFETs; Performance analysis; Radio frequency; Rapid thermal processing; Telecommunications; Voltage;
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
