• DocumentCode
    1949601
  • Title

    Versatile RF Measurement System to Thoroughly Evaluate the Non-linear Behaviour of SOI versus Bulk CMOS Technologies

  • Author

    Schreurs, D. ; Vandenberghe, S. ; Nauwelaers, B. ; Meer, H. Van ; Lyu, J. ; Kubicek, S. ; Meyer, K. De

  • Author_Institution
    Katholieke Universiteit Leuven, Belgium
  • Volume
    1
  • fYear
    1999
  • fDate
    13-15 Sept. 1999
  • Firstpage
    376
  • Lastpage
    379
  • Keywords
    CMOS technology; Circuits; Fabrication; MOS devices; MOSFETs; Performance analysis; Radio frequency; Rapid thermal processing; Telecommunications; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1999. Proceeding of the 29th European
  • Conference_Location
    Leuven, Belgium
  • Print_ISBN
    2-86332-245-1
  • Type

    conf

  • Filename
    1505518
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1949601