DocumentCode :
1949668
Title :
The Self-Heating Effect and its Influence on the Electrical Properties of SOI MOSFETs
Author :
Chai, Z. ; Berger, M.
Author_Institution :
Dept. of Elec. Devices and Circuits, Univ. Duisburg, Germany
fYear :
1992
fDate :
6-8 Oct. 1992
Firstpage :
78
Lastpage :
79
Keywords :
Analytical models; Circuits and systems; Electric resistance; Electrothermal effects; Energy consumption; MOSFETs; Microelectronics; Temperature; Thermal resistance; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOI Conference, 1992. IEEE International
Conference_Location :
Ponte Vedra Beach, FL
ISSN :
1078-621X
Print_ISBN :
0-7803-7439-8
Type :
conf
DOI :
10.1109/SOI.1992.664803
Filename :
664803
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1949668
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