DocumentCode
1949733
Title
Fracture behaviour of adhesive bonds by different shear speed
Author
Paproth, A. ; Walter, S. ; Wolter, K.-J.
Author_Institution
Electron. Packaging Lab., Tech. Univ. Dresden, Dresden
fYear
2008
fDate
27-30 May 2008
Firstpage
1679
Lastpage
1683
Abstract
Electrically conductive adhesives are an interesting alternative for environmentally friendly electronic packaging. Polymers are insufficient examinated regarding their mechanical behaviour in comparison with solder materials. The chemical constitution of polymers is more complicated than metals and ceramics. Based on structural constitution the visco-elastic and the visco-plastic deformation behaviour of polymers show an intense dependence on temperature and speed of strain. The glass transition temperature Tg is a significant parameter for polymers [1], [2]. For destructive testing with a mechanical load it is important on which working temperature the stress occurs: below, above or near glass transition temperature Tg [1]. All kinds of polymers (thermoplastic, elastomer, duromer) are based on linear molecular chains. Dipole, hydrogen or van-der-Waals-bonds can appear depending on the molecular structure. Additional the linear molecular chains are bonded more or less with covalent bonds getting a molecular network. Epoxide resins are amorphous duromer and have a high cross linking density (10-2...10-1)[1]. A high cross linking density has an important effect on the properties of the adhesive, for example high strength and chemical stability. In comparison with metals and ceramics the elastic modules of polymers are much lower and the kind of bonds between molecular chains determines the mechanical stiffness.
Keywords
adhesive bonding; conductive adhesives; electronics packaging; fracture; solders; adhesive bonds; amorphous duromer; covalent bonds; destructive testing; electrically conductive adhesives; electronic packaging; epoxide resins; fracture behaviour; glass transition temperature; linear molecular chains; shear speed; solder materials; structural constitution; visco-elastic deformation; visco-plastic deformation; Ceramics; Chemicals; Conducting materials; Conductive adhesives; Constitution; Electronics packaging; Glass; Joining processes; Polymers; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location
Lake Buena Vista, FL
ISSN
0569-5503
Print_ISBN
978-1-4244-2230-2
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2008.4550204
Filename
4550204
Link To Document