• DocumentCode
    1949752
  • Title

    Forward slicing algorithm based test data generation

  • Author

    Samuel, Philip ; Surendran, Anupama

  • Author_Institution
    Inf. Technol. Div., Cochin Univ. of Sci. & Technol., Kochi, India
  • Volume
    8
  • fYear
    2010
  • fDate
    9-11 July 2010
  • Firstpage
    270
  • Lastpage
    274
  • Abstract
    In this paper we have suggested a new method for test data generation using dynamic forward slicing algorithm. Separating the suspicious parts of code from the original program will make the process of test data generation easier. In forward dynamic slicing, the slices produced are much smaller than the original program and the search space for testing is considerably reduced. In this paper, we discuss the forward algorithm and the advantages of using forward dynamic algorithm for test data generation. The test cases are generated by analyzing the constraints present in the slices constructed from forward dynamic slicing algorithm. In the proposed method, the program for which the test data to be generated is analyzed. Forward slicing of the program is done with respect to all the variables whose value is changed during program execution. Slices obtained are then verified for statements which define certain constraints for test data generation. This helps to clearly define the limits of test data and remove the ambiguities about the value of the test data which is to be generated. The test data is then generated based on the constraints. In the proposed method, since forward algorithm is used, the execution traces need not be recorded and analyzing the constraints present in the slices will help in fault localization and debugging. This is one of the most important advantages of our method.
  • Keywords
    program debugging; program slicing; program testing; software fault tolerance; dynamic forward slicing algorithm; fault debugging; fault localization; forward dynamic algorithm; program code; program execution; program testing; search space; test case; test data generation; Variable speed drives; Test data generation; dynamic slicing; forward algorithm; static slicing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Information Technology (ICCSIT), 2010 3rd IEEE International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-5537-9
  • Type

    conf

  • DOI
    10.1109/ICCSIT.2010.5564611
  • Filename
    5564611