DocumentCode
1949939
Title
A validation method for parasitic capacitance extraction
Author
Bennebroek, M.T. ; Klaassen, D.B.M.
Author_Institution
Philips Research Laboratories, Eindhoven, The Netherlands
Volume
1
fYear
1999
fDate
13-15 Sept. 1999
Firstpage
448
Lastpage
451
Keywords
Circuit simulation; Circuit testing; Delay lines; Design automation; Integrated circuit interconnections; Integrated circuit layout; Oscillators; Parasitic capacitance; Pulse width modulation inverters; Space technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location
Leuven, Belgium
Print_ISBN
2-86332-245-1
Type
conf
Filename
1505536
Link To Document