DocumentCode :
1949953
Title :
Novel Parameter Extraction Techniques for Low-Voltage, Low-Power Technologies
Author :
Minehane, S. ; McCarthy, K.G. ; O´Sullivan, P. ; Mathewson, A.
Author_Institution :
National Microelectronics Research Centre, Cork, Ireland
Volume :
1
fYear :
1999
fDate :
13-15 Sept. 1999
Firstpage :
452
Lastpage :
455
Keywords :
CMOS process; Data mining; Equations; MOSFET circuits; Microelectronics; Parameter extraction; Postal services; Semiconductor device modeling; Threshold voltage; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
Type :
conf
Filename :
1505537
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1949953
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