Title :
Identification of partially observable discrete event manufacturing systems
Author :
Estrada-Vargas, Ana Paula ; Lopez-Mellado, Ernesto ; Lesage, Jean-Jacques
Author_Institution :
CINVESTAV Unidad Guadalajara, Zapopan, Mexico
Abstract :
This paper deals with black-box identification of discrete event manufacturing systems that are automated using a programmable logic controller (PLC). The behavior of the system is observed during its operation and is represented by a single long sequence w of observed input/output (I/O) signals vectors. The identification method, conceived for addressing large and complex industrial systems, consists of two complementary stages; the first one obtains, from w, the observable part of an interpreted Petri net (PN) model composed of observable places and transitions describing the reactive behavior of the system. Afterwards, w is transformed into a sequence S of transition firings from which a PN model that reproduces S is inferred. This paper focuses on the second stage of the method in which a PN is built by adding non-labeled places and arcs that represent the non-observed behavior of the whole system by assuring the reproduction of w; this technique is based on discovering the causal and concurrent relationships between transitions in S.
Keywords :
Petri nets; discrete event systems; identification; manufacturing systems; programmable controllers; I/O signals vectors; PLC; PN model; black-box identification method; complex industrial systems; input/output signal vector; interpreted Petri net; nonlabeled places; nonobserved behavior; partially observable discrete event manufacturing systems; programmable logic controller; system behavior; system reactive behavior; transition firings; Biological system modeling; Buildings; Concurrent computing; Firing; Manufacturing systems; Mathematical model; Vectors; Automated manufacturing systems; Black-box identification; Internal behaviour model; Interpreted Petri nets;
Conference_Titel :
Emerging Technologies & Factory Automation (ETFA), 2013 IEEE 18th Conference on
Conference_Location :
Cagliari
Print_ISBN :
978-1-4799-0862-2
DOI :
10.1109/ETFA.2013.6648052