DocumentCode :
1950245
Title :
Efficient sampling of reference noise in a switched capacitor ΣΔ ADC
Author :
O´Connell, Ivan John ; Lyden, Colin
Author_Institution :
Dept. of Microelectron., Nat. Univ. of Ireland, Cork, Ireland
fYear :
2004
fDate :
3-6 Oct. 2004
Firstpage :
531
Lastpage :
534
Abstract :
The implementation of an efficient sampling technique whereby the reference capacitor is selectively sampled within a switched capacitor ΣΔ ADC is presented, resulting in improved thermal noise performance. When a transition occurs in the modulator feedback, the reference capacitors are not sampled but instead discharged to ground. The introduction of a do-not-sample state requires that the ΣΔ modulator is compensated. For mid-scale inputs, the overall ADC noise is reduced by 5.6 dB, without any increase in power consumption.
Keywords :
circuit feedback; compensation; digital-analogue conversion; integrating circuits; sigma-delta modulation; signal sampling; switched capacitor networks; thermal noise; do-not-sample state; ground discharged reference capacitors; modulator compensation; modulator feedback transitions; reference DAC; reference noise sampling; sampled reference capacitor; switched capacitor bilinear integrators; switched capacitor sigma-delta ADC; thermal noise; Batteries; Capacitors; Chromium; Energy consumption; Feedback; Microelectronics; Noise reduction; Sampling methods; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 2004. Proceedings of the IEEE 2004
Print_ISBN :
0-7803-8495-4
Type :
conf
DOI :
10.1109/CICC.2004.1358876
Filename :
1358876
Link To Document :
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