• DocumentCode
    1950351
  • Title

    Chip scale studies of BCB based polymer bonding for MEMS packaging

  • Author

    Wang, C.H. ; Zeng, J. ; Zhao, K. ; Chan, H.L.

  • Author_Institution
    Sch. of Eng. & Phys. Sci., Heriot-Watt Univ., Edinburgh
  • fYear
    2008
  • fDate
    27-30 May 2008
  • Firstpage
    1869
  • Lastpage
    1873
  • Abstract
    This paper presents chip scale investigation of polymer based bonding processes for producing microcavities for encapsulation of MEMS and other microscale devices. The polymer sealing rings were fabricated on the glass covers using the photosensitive BCB polymer and photolithography. They were bonded onto a variety of substrates including silicon substrates, aluminum coated substrates and glass substrates with feedthrough structures to investigate the properties of polymer bonding under different conditions. A high-yield BCB bonding procedure was established. For hotplate based bonding, a pre-bonding step is essential to ensure defect-free polymer seal. The optimized bonding process requires pre-bonding at 150degC for 5 minutes followed by final bonding at 250degC for 15 minutes. The capability of sealing feedthrough structures on a substrate of the BCB polymer was demonstrated using 0.5 mum thick titanium line structures. Fast bonding using laser assisted curing was achieved in less than 10 seconds, representing a factor of ~100 of improvement over the hotplate based approach. The quality of the polymer seal was evaluated using optical inspection and leak and shear tests.
  • Keywords
    bonding processes; chip scale packaging; microcavities; micromechanical devices; photolithography; polymers; BCB based polymer bonding; MEMS packaging; high-yield BCB bonding proced; microcavity; optical inspection; photolithography; shear test; Bonding processes; Chip scale packaging; Encapsulation; Glass; Lithography; Microcavities; Micromechanical devices; Optical polymers; Seals; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-2230-2
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2008.4550236
  • Filename
    4550236