Title :
A New Lifetime Extrapolation Technique for LDD NMOSFETs under Hot-Carrier Degradation
Author :
Dreesen, R. ; Croes, K. ; Manca, J. ; Ceuninck, W. De ; Schepper, L. De ; Pergoot, A. ; Groeseneken, G.
Author_Institution :
Limburgs University Centre, Diepenbeek, Belgium
Keywords :
Aging; Analytical models; CMOS process; Degradation; Extrapolation; Hot carriers; Interface states; MOSFETs; Measurement techniques; Stress;
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
