1950579

A Compact MOSFET Breakdown Model for Optimization of Gate Coupled ESD Protection Circuits

Vassilev, Vessen ; Groeseneken, Guido ; Bock, Karlheinz ; Maes, H.E.

IMEC, Leuven, Belgium

1

1999

13-15 Sept. 1999

600

603

CMOS technology; Circuit simulation; Coupling circuits; Electric breakdown; Electrostatic discharge; MOSFET circuits; Protection; Resistors; Semiconductor device modeling; Voltage;

English

ieee

Solid-State Device Research Conference, 1999. Proceeding of the 29th European

Leuven, Belgium

2-86332-245-1

conf

1505574