Back-bias Enhanced Source-Side Injection in 0.25um Embedded Flash Memories
Author :
Houdt, J. Van ; Verheyen, P. ; Frisson, J. ; Wellekens, D. ; Lorenzini, M. ; Maes, H.E.
Author_Institution :
IMEC, Leuven, Belgium
Volume :
1
fYear :
1999
fDate :
13-15 Sept. 1999
Firstpage :
608
Lastpage :
611
Keywords :
Channel hot electron injection; Current measurement; Flash memory; Flash memory cells; Impact ionization; Manufacturing; Secondary generated hot electron injection; Semiconductor memory; Substrate hot electron injection; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
