• DocumentCode
    1950802
  • Title

    Temperature Sensitivity of Devices and Circuits Fabricated in Fully Depleted Accumulation Mode Cmos/sol

  • Author

    Brady, F.T. ; Haddad, N.F. ; Wang, L.K. ; Miller, J.A. ; Seliskar, J.

  • Author_Institution
    IBM Federal Systems Company, Manassas, VA
  • fYear
    1992
  • fDate
    6-8 Oct. 1992
  • Firstpage
    90
  • Lastpage
    91
  • Keywords
    CMOS technology; Circuit optimization; Degradation; Positron emission tomography; Random access memory; Temperature distribution; Temperature sensors; Thin film circuits; Thin film devices; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference, 1992. IEEE International
  • Conference_Location
    Ponte Vedra Beach, FL
  • ISSN
    1078-621X
  • Print_ISBN
    0-7803-7439-8
  • Type

    conf

  • DOI
    10.1109/SOI.1992.664809
  • Filename
    664809
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1950802