Title :
Large Signal Modeling and Verification of Silicon RF Power Transistors
Author :
Tinti, R. ; Mouthaan, K. ; de Graaff, H.C. ; Slotboom, J. ; Tauritz, J.L. ; Tuijtelaars, R. ; Versleijen, M.
Author_Institution :
Delft University of Technology, The Netherlands
Keywords :
Bonding; Capacitors; Inductance; Power transistors; RF signals; Radio frequency; Semiconductor device modeling; Semiconductor device packaging; Silicon; Testing;
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
