• DocumentCode
    1950935
  • Title

    Taking advantage of optimal on-chip parallelism for parallel discrete-event simulation

  • Author

    Briner, J.V., Jr. ; Ellis, J.L. ; Kedem, G.

  • Author_Institution
    Dept. of Comput. Sci., Duke Univ., Durham, NC, USA
  • fYear
    1988
  • fDate
    7-10 Nov. 1988
  • Firstpage
    312
  • Lastpage
    315
  • Abstract
    The optimal level of performance from parallel discrete-event simulation depends on the circuit being simulated, the vectors being simulated, and the machine on which the simulation is being performed. Empirical studies based on very simple models suggest that the amount of parallelism available in typical circuits is very small. A model of optimal performance for a machine with an infinite number of processors having uniform memory accesses is presented. It demonstrates that some circuits have significantly more parallelism than previously believed. The model is refined to define the optimal load partitioning for a machine with a finite number of processors with uniform access and extended to define the optimal static data partitioning. A metric is obtained which can be used to benchmark different models of parallel simulation. The effectiveness of these models in detecting performance problems of the version of RSIM running on the BBN Butterfly is shown.<>
  • Keywords
    circuit analysis computing; parallel architectures; parallel machines; performance evaluation; BBN Butterfly; RSIM; infinite processors; metric; optimal load partitioning; optimal on-chip parallelism; optimal performance; optimal static data partitioning; parallel discrete-event simulation; performance problems; uniform memory accesses; Circuit simulation; Computational modeling; Computer science; Concurrent computing; Data mining; Discrete event simulation; Event detection; Lifting equipment; Load management; Parallel processing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 1988. ICCAD-88. Digest of Technical Papers., IEEE International Conference on
  • Conference_Location
    Santa Clara, CA, USA
  • Print_ISBN
    0-8186-0869-2
  • Type

    conf

  • DOI
    10.1109/ICCAD.1988.122518
  • Filename
    122518