DocumentCode
1950979
Title
The crazy mixed up world of silicon debug [IC validation]
Author
Josephson, Doug ; Gottlieb, Bob
Author_Institution
Hewlett-Packard Co., USA
fYear
2004
fDate
3-6 Oct. 2004
Firstpage
665
Lastpage
670
Abstract
In this paper, we give an overview of the silicon debug process. We discuss the procedure of debug, along with the current state of the art tools and design features used to assist in the process of doing debug. In conclusion, we discuss what new challenges lay ahead in the area of silicon debug.
Keywords
integrated circuit design; integrated circuit testing; Si; debug design features; debug tools; electrical validation; functional validation plan; silicon debug process; Chip scale packaging; Computer bugs; Delay; Design engineering; Fabrication; Frequency; Manufacturing; Production; Silicon; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 2004. Proceedings of the IEEE 2004
Print_ISBN
0-7803-8495-4
Type
conf
DOI
10.1109/CICC.2004.1358915
Filename
1358915
Link To Document