• DocumentCode
    1950984
  • Title

    On real time reflector surface distortion determination

  • Author

    Imbriale, William A. ; Jamnejad, Vahraz

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA
  • fYear
    2009
  • fDate
    23-27 March 2009
  • Firstpage
    3100
  • Lastpage
    3104
  • Abstract
    Gain loss in large reflector antennas due to main reflector surface distortion is a significant problem in both ground and spacecraft antennas. There are several techniques under development to compensate for these distortions. However, distortions due to thermal effects are time varying and generally not known a priori. Therefore, to compensate for these distortions, it is necessary to determine the characteristics of the actual distortion in real time. Three techniques for real time measuring of the main reflector surface distortion are discussed. 1) A two-camera optical surface-measuring system using photogrammetry, 2) A small array feed placed in the focal plane of the reflector system and 3) Small probes placed on the subreflector. It was demonstrated that all three methods can recover the main reflector distortion with the subreflector probe method seeming to offer the simplest (least number of probes and minimal computation) implementation. This paper describes an experiment to verify the subreflector probe technique.
  • Keywords
    antenna arrays; focal planes; reflector antenna feeds; focal plane; gain loss; ground antenna; large reflector antennas; photogrammetry; real time reflector surface distortion determination; reflector surface distortion; spacecraft antennas; subreflector probe technique; thermal effects; two-camera optical surface-measuring system; Apertures; Cameras; Distortion measurement; Feeds; Optical arrays; Optical distortion; Phased arrays; Probes; Reflector antennas; Sampling methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation, 2009. EuCAP 2009. 3rd European Conference on
  • Conference_Location
    Berlin
  • Print_ISBN
    978-1-4244-4753-4
  • Electronic_ISBN
    978-3-00-024573-2
  • Type

    conf

  • Filename
    5068259