Title :
Rapid Thermal Processing for Improved Polysilicon Soi Nmosfets
Author :
Chand, Ami ; Chandra, Sudhir ; Rustagi, S.C. ; Bhattacharyya, A.B.
Author_Institution :
Indian Institute of Technology
Keywords :
Doping; Grain boundaries; Hydrogen; Implants; MOSFETs; Passivation; Plasma displays; Plasma temperature; Rapid thermal annealing; Rapid thermal processing;
Conference_Titel :
SOI Conference, 1992. IEEE International
Conference_Location :
Ponte Vedra Beach, FL
Print_ISBN :
0-7803-7439-8
DOI :
10.1109/SOI.1992.664810