Title :
Non-standard physicochemical and electrical examinations in thick-film and LTCC technologies
Author :
Dziedzic, Andrzej
Author_Institution :
Inst. of Microsyst. Technol., Wroclaw Univ. of Technol., Poland
Abstract :
The aim of this paper is to present and discuss some non-standard diagnostic methods used for physicochemical and electrical investigations of raw materials, inks, films and devices necessary for or fabricated by polymer or cermet thick-film technology as well as Low Temperature Cofired Ceramics (LTCC) one. Both manufacturer´s and user´s point of view are presented. Besides description of particular methods, their results and conclusions affected improvement of thick-film device fabrication and reliability increase is discussed
Keywords :
ceramics; thick films; LTCC technology; cermet thick film technology; diagnostic method; electrical analysis; ink; low temperature cofired ceramic; physicochemical analysis; polymer thick film technology; reliability; Ceramics; Fabrication; Ink; Manufacturing; Optical films; Optical microscopy; Polymer films; Raw materials; Temperature; X-ray lasers;
Conference_Titel :
Microelectronics, 2000. Proceedings. 2000 22nd International Conference on
Conference_Location :
Nis
Print_ISBN :
0-7803-5235-1
DOI :
10.1109/ICMEL.2000.838740
