Title :
RELAB: A tool to include MOSFETs BTI and variability in SPICE simulators
Author :
Martin-Martinez, J. ; Ayala, N. ; Rodriguez, R. ; Nafria, M. ; Aymerich, X.
Author_Institution :
Dept. Eng. Electron., Univ. Autonoma de Barcelona, Barcelona, Spain
Abstract :
RELAB is a new simulation tool for circuit reliability evaluation, based on the physical models of different degradation phenomena. In this work, the RELAB capabilities to include Bias Temperature Instability (BTI) and its variability in SPICE simulators is presented.
Keywords :
MOSFET; SPICE; semiconductor device reliability; MOSFET BTI; MOSFET variability; RELAB capabilities; RELAB tool; SPICE simulators; bias temperature instability; circuit reliability evaluation; degradation phenomena; physical models; simulation tool; Degradation; Integrated circuit modeling; Integrated circuit reliability; SPICE; Stress; Transistors;
Conference_Titel :
Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2012 International Conference on
Conference_Location :
Seville
Print_ISBN :
978-1-4673-0685-0
DOI :
10.1109/SMACD.2012.6339386
