Title :
New Findings on Hot-Carrier Stress in Large Grain Excimer Annealed N-Channel Polysilicon TFTs
Author :
Farmakis, F.V. ; Brini, J. ; Kamarinos, G. ; Angelis, C.T. ; Dimitriadis, C.A. ; Miyasaka, M.
Author_Institution :
LPCS / ENSERG, Grenoble, France
Keywords :
Annealing; Degradation; Grain size; Hot carriers; Laser modes; Performance evaluation; Stress; Thin film transistors; Transmission electron microscopy; Voltage;
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
