DocumentCode :
1951221
Title :
Error analysis for high resolution topography with bi-static single-pass SAR interferometry
Author :
Muellerschoen, Ronald J. ; Chen, Curtis W. ; Hensley, Scott ; Rodriguez, Ernesto
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fYear :
2006
fDate :
24-27 April 2006
Abstract :
We present a flow down error analysis from the radar system to topographic height errors for bi-static single pass SAR interferometry for a satellite tandem pair. Because of orbital dynamics the baseline length and baseline orientation evolve spatially and temporally, the height accuracy of the system is modeled as a function of the spacecraft position and ground location. Vector sensitivity equations of height and the planar error components due to metrology, media effects, and radar system errors are derived and evaluated globally for a baseline mission. Included in the model are terrain effects that contribute to layover and shadow and slope effects on height errors. The analysis also accounts for non-overlapping spectra and the non-overlapping bandwidth due to differences between the two platforms´ viewing geometries. The model is applied to a 514 km altitude 97.4 degree inclination tandem satellite mission with a 300 m baseline separation and X-band SAR. Results from our model indicate that global DTED (digital terrain elevation data) level 3 can be achieved.
Keywords :
interferometry; microwave measurement; radar resolution; synthetic aperture radar; terrain mapping; topography (Earth); 300 m; 514 km; DTED; baseline orientation; bistatic single pass SAR interferometry; digital terrain elevation data; error analysis; ground vector sensitivity equation; high resolution topography; metrology; radar system; satellite tandem pair; spacecraft position; synthetic aperture radar; terrain effect; Equations; Error analysis; Interferometry; Metrology; Satellites; Space vehicles; Spaceborne radar; Spatial resolution; Surfaces; Synthetic aperture radar;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radar, 2006 IEEE Conference on
Print_ISBN :
0-7803-9496-8
Type :
conf
DOI :
10.1109/RADAR.2006.1631866
Filename :
1631866
Link To Document :
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