Title :
Cmos/sos Ri-1750ab Processor
Author :
Koczela, Louis J.
Author_Institution :
Rockwell International Corporation, Anaheim, Ca.
Keywords :
CMOS process; Extraterrestrial measurements; Frequency measurement; Metallization; Orbital calculations; Power measurement; Qualifications; Scanning electron microscopy; Semiconductor device measurement; Testing;
Conference_Titel :
SOI Conference, 1992. IEEE International
Conference_Location :
Ponte Vedra Beach, FL
Print_ISBN :
0-7803-7439-8
DOI :
10.1109/SOI.1992.664811