Title :
Automatic inspection of SET sensitivity in analog cells
Author :
Márquez, F. ; Muñoz, F. ; Palomo, F.R. ; Aguirre, M.A. ; Ullán, M.
Author_Institution :
Dipt. de Ing. Electron., Univ. of Seville, Seville, Spain
Abstract :
In this paper, a software simulation tool for automation of electrical sensitivity analysis of Single Event Effects (SEE) is presented. In particular, the proposed tool can be used to check the error sensitivity of analog designs with large number of transistors. The proposed methodology allows a rapid location of critical nodes in order to ensure a proper radiation-hardened performance under the influence of current injected Single Event Transient Effects (SET). As a case study, several operational amplifier architectures have been designed and simulated in a 130 nm CMOS technology, validating the performance of the implemented analysis method.
Keywords :
CMOS analogue integrated circuits; circuit analysis computing; inspection; operational amplifiers; radiation hardening (electronics); sensitivity analysis; software tools; CMOS technology; SET sensitivity automatic inspection; analog cells; current injected single event transient effects; electrical sensitivity analysis; error sensitivity analysis; operational amplifier architectures; radiation-hardened performance; size 130 nm; software simulation tool; transistors; Analog circuits; Analytical models; CMOS integrated circuits; Oceans; Sensitivity; Transient analysis; Transistors; CMOS; SET; radiation-hardened; simulation tool;
Conference_Titel :
Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2012 International Conference on
Conference_Location :
Seville
Print_ISBN :
978-1-4673-0685-0
DOI :
10.1109/SMACD.2012.6339394
