Automatic inspection of SET sensitivity in analog cells

Author

Márquez, F. ; Muñoz, F. ; Palomo, F.R. ; Aguirre, M.A. ; Ullán, M.

Author_Institution

Dipt. de Ing. Electron., Univ. of Seville, Seville, Spain

fYear

2012

fDate

19-21 Sept. 2012

Firstpage

281

Lastpage

284

Abstract

In this paper, a software simulation tool for automation of electrical sensitivity analysis of Single Event Effects (SEE) is presented. In particular, the proposed tool can be used to check the error sensitivity of analog designs with large number of transistors. The proposed methodology allows a rapid location of critical nodes in order to ensure a proper radiation-hardened performance under the influence of current injected Single Event Transient Effects (SET). As a case study, several operational amplifier architectures have been designed and simulated in a 130 nm CMOS technology, validating the performance of the implemented analysis method.

Keywords

CMOS analogue integrated circuits; circuit analysis computing; inspection; operational amplifiers; radiation hardening (electronics); sensitivity analysis; software tools; CMOS technology; SET sensitivity automatic inspection; analog cells; current injected single event transient effects; electrical sensitivity analysis; error sensitivity analysis; operational amplifier architectures; radiation-hardened performance; size 130 nm; software simulation tool; transistors; Analog circuits; Analytical models; CMOS integrated circuits; Oceans; Sensitivity; Transient analysis; Transistors; CMOS; SET; radiation-hardened; simulation tool;

fLanguage

English

Publisher

ieee

Conference_Titel

Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2012 International Conference on

Conference_Location

Seville

Print_ISBN

978-1-4673-0685-0

Type

conf

DOI

10.1109/SMACD.2012.6339394

Filename

6339394