Title :
High level simulations of real-time built-in self-test of Σ-Δ A/D converters
Author :
Strle, Drago ; Trontelj, Janez
Author_Institution :
EE Dept., Univ. of Ljubljana, Ljubljana, Slovenia
Abstract :
In this paper we discuss a possibility to simplify modeling and simulation of testing strategy of high-resolution ΣΔ modulators. The methodology could be used for production as well as for real time built-in self-tests. We show that a pseudo-random signal is a good option for a signal source and that test method leads to efficient and cost-effective testing that can also be used for real time built-in self-tests. The method is theoretically analyzed and verified using Matlab simulations. The models of DUT (device under test) and reference digital circuits are simulated and the difference is demonstrated with simple area-efficient algorithm/hardware.
Keywords :
built-in self test; circuit simulation; integrated circuit testing; sigma-delta modulation; ΣΔ A-D converters; DUT model; Matlab simulations; cost-effective testing; device-under-test; high-level simulations; high-resolution ΣΔ modulators; pseudorandom signal; real-time built-in self-test; reference digital circuits; signal source; testing strategy; Circuit faults; Hardware; Integrated circuit modeling; Modulation; Noise; Real-time systems; Testing; Simulation of Built-in-self- test; Simulation of efficient test of mixed-signal circuits; real time test of mixed-signal circuits;
Conference_Titel :
Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2012 International Conference on
Conference_Location :
Seville
Print_ISBN :
978-1-4673-0685-0
DOI :
10.1109/SMACD.2012.6339395
