Title :
UVM-based verification of smart-sensor systems
Author :
Neumann, Felix ; Sathyamurthy, Muralikrishna ; Kotynia, Lukasz ; Hennig, Eckhard ; Sommer, Ralf
Author_Institution :
Tech. Univ. of Ilmenau, Ilmenau, Germany
Abstract :
In this contribution, we present a UVM-based methodology for mixed-signal smart-sensor systems. Our approach permits the validation of system functionality before implementation and to verify implementations on various levels of abstraction. The model-based verification approach also helps to build a scalable and re-usable framework, in which assertions and constrained random-stimuli are used to monitor and verify mixed-signal system behavior automatically. Along with the designed UVM -testbench architecture, we describe a novel solution for estimating the power consumption of digital block using application-specific random activity patterns generated during testbench runs.
Keywords :
intelligent sensors; UVM test-bench architecture; UVM-based verification; application-specific random activity patterns; constrained random-stimuli; digital block; mixed-signal smart-sensor systems; mixed-signal system behavior; model-based verification approach; power consumption; system functionality validation; universal verification methodology; Analytical models; Estimation; Hardware design languages; Monitoring; Radiofrequency identification; Switches; System-on-a-chip; UVM; mixed-signal verification; power estimation; smart -sensor;
Conference_Titel :
Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2012 International Conference on
Conference_Location :
Seville
Print_ISBN :
978-1-4673-0685-0
DOI :
10.1109/SMACD.2012.6339407