• DocumentCode
    1951603
  • Title

    A CAD framework for the characterization and use of memristor models

  • Author

    García-Redondo, Fernando ; López-Vallejo, Marisa ; Ituero, Pablo ; Barrio, Carlos López

  • Author_Institution
    E.T.S.I. Telecomun., Univ. Politec. de Madrid, Madrid, Spain
  • fYear
    2012
  • fDate
    19-21 Sept. 2012
  • Firstpage
    25
  • Lastpage
    28
  • Abstract
    In the recent years the missing fourth component, the memristor, was successfully synthesized. However, the mathematical complexity and variety of the models behind this component, in addition to the existence of convergence problems in the simulations, make the design of memristor-based applications long and difficult. In this work we present a memristor model characterization framework which supports the automated generation of subcircuit files. The proposed environment allows the designer to choose and parameterize the memristor model that best suits for a given application. The framework carries out characterizing simulations in order to study the possible non-convergence problems, solving the dependence on the simulation conditions and guaranteeing the functionality and performance of the design. Additionally, the occurrence of undesirable effects related to PVT variations is also taken into account. By performing a Monte Carlo or a corner analysis, the designer is aware of the safety margins which assure the correct device operation.
  • Keywords
    CAD; Monte Carlo methods; mathematical analysis; memristors; CAD framework; Monte Carlo analysis; PVT variations; automated generation; corner analysis; mathematical complexity; memristor models; nonconvergence problems; subcircuit files; Analytical models; Biological system modeling; Computational modeling; Integrated circuit modeling; Load modeling; Mathematical model; Memristors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2012 International Conference on
  • Conference_Location
    Seville
  • Print_ISBN
    978-1-4673-0685-0
  • Type

    conf

  • DOI
    10.1109/SMACD.2012.6339408
  • Filename
    6339408