• DocumentCode
    1951632
  • Title

    Trends in low-voltage embedded RAMs

  • Author

    Itoh, Kiyoo ; Osada, Kenichi ; Kawahara, Takayuki

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Japan
  • fYear
    2004
  • fDate
    20-23 June 2004
  • Firstpage
    45
  • Lastpage
    48
  • Abstract
    Low-voltage high-density embedded (e-) RAMs, focusing on RAM cells and peripheral circuits, are described. First, challenges and trends in low-voltage e-RAMs are described based on the S/N issue of RAM cells, and leakage and speed-variation issues of peripheral circuits. Next, state-of-the-art low-voltage e-DRAMs and e-SRAMs are investigated, focusing on leakage reduction. Finally, future prospects for e-RAMs are discussed in terms of low-voltage designs.
  • Keywords
    DRAM chips; SRAM chips; embedded systems; low-power electronics; RAM cells; leakage reduction; low voltage design; low voltage e-DRAM; low voltage e-SRAM; low voltage embedded RAM; peripheral circuits; Capacitance; Circuits; Degradation; Low voltage; Power dissipation; Power supplies; Random access memory; Samarium; Signal to noise ratio; Subthreshold current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2004. NEWCAS 2004. The 2nd Annual IEEE Northeast Workshop on
  • Print_ISBN
    0-7803-8322-2
  • Type

    conf

  • DOI
    10.1109/NEWCAS.2004.1359012
  • Filename
    1359012